Dr. Alan S. Kaufman, an expert on intelligence testing, will present a talk titled "IQ Tests: Their History, Controversies, and Relevance for Future Practitioners." He will present on Tuesday April 11th from 12:30pm to 1:30pm, followed by Q & A, in Gentry room 144.
Dr. Kaufman is Clinical Professor of Psychology at Yale University's Child Study Center in the School of Medicine. He has expertise in psychometrics, test construction, and clinical assessment. From 1970-74 he worked with Dr. David Wechsler in developing the WISC-R. His 1979 text Intelligent Testing with the WISC-R influenced how a generation of psychologists interpreted IQ test profiles. With his wife and scholarly colleague, Nadeen, Alan is the co-creator of several widely used tests including the Kaufman Assessment Battery for Children (KABC), Kaufman Brief Intelligence Test (KBIT), Kaufman Test of Educational Achievement (KTEA), and many more—most recently the 2022 KBIT-2 Revised. For a full bio see: https://www.pearsonassessments.com/professional-assessments/products/authors/kaufman-alan.html
For more information, contact: Jackie Caemmerer at jacqueline.caemmerer@uconn.edu